in 1981, SolveTech, Inc. is a leader in the design and application
of non-contact thickness/basis weight gauging systems based on dielectric
measurement principles. The first generation of gauges were developed
in 1986 to test variability in thickness on polyester film lines.
The company went on to enhance the technology and, in 1988, introduced
the first commercially viable, double-sided (parallel plate) capacitance
gauges. This technology brought significant new levels of performance
in accuracy and speed, along with the concepts of user-definable
measurement footprints and gaps.
1989, SolveTech developed and installed the first Array gauges.
These gauges provided the first high speed "terrain maps"
of extruded products. In subsequent years, there has been continuous
improvement to the technology. It has been successfully applied
to numerous applications involving a wide variety of materials and
here to learn more about SolveTech's Measurement Principle.