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General Questions
Calibration is individual to each material and is performed by the customer.  The good news is that calibration is quick and easy.  For our lab instruments (the SC1000 and PR2000), the calibration procedures are laid out in ASTM Standard D8136. With each instrument, there are a number of calibration options.  For on-line systems, calibration can be done by matching the gauge to the average thickness of many data points.  It can also be calibrated off line using a spot measurement on a material of known thickness. When it comes to calibration, there are two critical points regarding SolveTech's technology.  The first is that the response is linear.  This means that a calibration on one thickness of material will be work for different thicknesses of the same material.  Second, the calibration is highly stable which gives it a number of advantages including average thickness control and matching instruments to each other.
SolveTech offers several ways to try the technology for yourself.   The first is sample testing, and you can request a sample test here.  With this sample test, you send us your material, and we can provide you with a video of testing along with a detailed report.  We can also do a live web demonstration for you. With much of our equipment, we offer equipment rentals to qualified customers.  We often apply a majority of this rental fee towards the purchase.
SolveTech has a proprietary noncontact capacitance based technology. The material is placed in a capacitor, and this capacitor senses a change to the capacitance of the system. The more material, the stronger the response, and the less material.
SolveTech specializes in measuring plastic film and our technology can measure the large majority of films.  There are some rare cases where we cannot measure the film, typically because the material is conductive to electricity.  When we are unsure, we offer a free sample test to the customer.  You can request a free sample test here.
We can measure multilayer films, and calibrating on these films is not an issue.  However we cannot distinguish between the individual layers.  We only measure the entire multilayer structure as a whole.

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